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The Open Database Of The Corporate World

INTERNATIONAL TEST SOLUTIONS, INC. had a Trademark Registration

Mark Text
international TEST SOLUTIONS
Mark Image
1006868
Internation Registration Number
1006868
Mark Form
image
Holder Name
International Test Solutions, Inc.
Holder Address
1595 Meadow Wood Lane, Reno NV 89502
Representative Name
Heather A. Dunn, Esq. DLA Piper LLP (US)
Representative Address
555 Mission Street Suite 2400, San Francisco CA 94105
Registration Date
2009-06-04
Expiry Date
2019-06-04
Goods and Services Classifications (EN)
  • 3 - Cleaning material comprised of polymer chains used to collect and/or remove debris generated during testing of integrated circuits.
Goods and Services Classifications (ES)
  • 3 - Productos de limpieza compuestos por cadenas poliméricas para recoger y eliminar desechos generados durante la prueba de circuitos integrados.
Goods and Services Classifications (FR)
  • 3 - Matériel de nettoyage constitué de chaînes polymériques destiné à recueillir et/ou supprimer les débris produits pendant les essais de circuits intégrés.
Register Name
World Intellectual Property Organisation
Register Website
http://www.wipo.int/

About Trademark Registrations

A trademark is recognizable text, design, image, or sensory mark which identifies products or services of a particular source from those of others

Raw data

Holders
Entity Type unknown
Entity Properties
Name International Test Solutions, Inc.
Addresses
Type unknown
Address
Street Address 1595 Meadow Wood Lane, Reno NV 89502
Country Code US
Jurisdiction Nevada, United States
Mark Details
Mark Text international TEST SOLUTIONS
Mark Image
Uid 1006868
Format jpg
Path 9/c/6/50783cdbead02ad79449796d63d615654b0fbe9a
Classification
Code Scheme wipo_nice
Code 3
Enhanced Descriptions
Description Cleaning material comprised of polymer chains used to collect and/or remove debris generated during testing of integrated circuits.
Language EN
Description Productos de limpieza compuestos por cadenas poliméricas para recoger y eliminar desechos generados durante la prueba de circuitos integrados.
Language ES
Description Matériel de nettoyage constitué de chaînes polymériques destiné à recueillir et/ou supprimer les débris produits pendant les essais de circuits intégrés.
Language FR
Mark Form image
Register wipo_madrid
Registration Date 2009-06-04
Uid 1006868
Expiry Date 2019-06-04
Representative
Entity Type unknown
Entity Properties
Name Heather A. Dunn, Esq. DLA Piper LLP (US)
Addresses
Type unknown
Address
Street Address 555 Mission Street Suite 2400, San Francisco CA 94105
Country Code US

Where we got this information from

Created By
an OpenCorporates bot
Source
external source
Confidence
very high
Added On
July 7 2017, 4.37PM

We think this was true on January 22 2013. We think this happened at June 4 2009.

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